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Structural analysis of arc deposited diamond-like carbon films by Raman and X-ray photoelectron spectroscopy

  • Liuhe Li*
  • , Haiquan Zhang
  • , Yanhua Zhang
  • , Paul K. Chu
  • , Xiubo Tian
  • , Lifang Xia
  • , Xinxin Ma
  • *Corresponding author for this work
  • Beihang University
  • City University of Hong Kong
  • Harbin Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

Diamond-like carbon (DLC) films were deposited using metal arc under different experimental conditions. The ultra microhardness and load-displacement curves show that the typical hardness values of the deposited films range from 10 to 100 GPa. The detailed relationship between the sp3 structure and the D peak observed in the Raman spectra is investigated. For further studies, the C1s binding energy was determined employing X-ray photoelectron spectroscopy. Our results disclose that DLC films with very different sp3 structures may exhibit similar D Raman peaks.

Original languageEnglish
Pages (from-to)95-101
Number of pages7
JournalMaterials Science and Engineering: B
Volume94
Issue number1
DOIs
StatePublished - 15 Jun 2002

Keywords

  • Diamond-like carbon films
  • Hardness
  • Raman spectroscopy
  • X-ray photoelectron spectroscopy

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