@inproceedings{b2240a837ccf4843abe8f27d87aec595,
title = "Storage reliability assessment for missile-borne electronic products with small sampling based on Bayes theorem",
abstract = "Based on the characteristic of small sampling of missile-borne electronic product, the life distribution form, the essential prior data and Storage Reliability composition of Missile-borne electronics products are firstly analyzed; after that, a new assessment algorithm of storage reliability based on Bayes theorem is presented, and the implementing steps of the algorithm are studied in detail, and then the point estimation and one-sided confidence lower limit of the storage reliability are provided. At last an example is given to shown validity of the method.",
keywords = "Bayes Theorem, Small Sample, Storage Reliability Assessment, electronic products, missile-borne",
author = "Zhijie Shao and Qingzhen Zhang and Yunpeng Li and Xuesong Ni",
year = "2011",
doi = "10.1109/ICIEA.2011.5976033",
language = "英语",
isbn = "9781424487554",
series = "Proceedings of the 2011 6th IEEE Conference on Industrial Electronics and Applications, ICIEA 2011",
pages = "2605--2609",
booktitle = "Proceedings of the 2011 6th IEEE Conference on Industrial Electronics and Applications, ICIEA 2011",
note = "2011 6th IEEE Conference on Industrial Electronics and Applications, ICIEA 2011 ; Conference date: 21-06-2011 Through 23-06-2011",
}