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Stimulate and eliminate electronic product design defects by reliability enhancement testing

  • Haixin Peng*
  • , Rui Kang
  • *Corresponding author for this work
  • Beihang University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper first introduces the test profile of Reliability Enhancement Testing(RET) then completed in the past three years, a large number of the implementation results of the RET test were statistically analyzed, given the distribution of the design defect, the last two design defects excitation and elimination process were be detailed explanation, and demonstrated it is exceptionally effective that the RET test inspire and eliminate electronic product design defects.

Original languageEnglish
Title of host publicationHealth, Structure, Material and Environment
Pages621-625
Number of pages5
DOIs
StatePublished - 2013
Event2012 International Conference of Health, Structure, Material and Environment, HSME 2012 - Shenzhen, China
Duration: 4 Dec 20125 Dec 2012

Publication series

NameAdvanced Materials Research
Volume663
ISSN (Print)1022-6680

Conference

Conference2012 International Conference of Health, Structure, Material and Environment, HSME 2012
Country/TerritoryChina
CityShenzhen
Period4/12/125/12/12

Keywords

  • Design defect
  • Reliability enhancement testing (RET)
  • Test profile

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