@inproceedings{af38f0976b804f4fa7fc523627c1fd9f,
title = "Statistical Process Control in Fused Deposition Modeling based on Tanimoto similarity of uniform surface images of product",
abstract = "this paper proposed a method to monitor the quality of Fused Deposition Modeling (FDM) products using Statistical Process Control (SPC) based on profile data. Profile data is extracted from product surface image of each layer. Tanimoto similarity between the current profile data and the ideal one is calculated, then used to monitor the manufacturing process. Simulation study is presented to show the property of this method. Case study is given finally as an application in FDM. The proposed method has significant potential for application in real-Time monitoring.",
keywords = "fused deposition modeling, profile monitoring, statistical process control",
author = "Shanggang Wang and Tingting Huang and Tao Hou",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 2nd International Conference on Reliability Systems Engineering, ICRSE 2017 ; Conference date: 10-07-2017 Through 12-07-2017",
year = "2017",
month = sep,
day = "8",
doi = "10.1109/ICRSE.2017.8030806",
language = "英语",
series = "2017 2nd International Conference on Reliability Systems Engineering, ICRSE 2017",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
editor = "Dongming Fan and Jun Yang and Ziyao Wang and Tingdi Zhao",
booktitle = "2017 2nd International Conference on Reliability Systems Engineering, ICRSE 2017",
address = "美国",
}