Spectroscopy

Zhihua Zhang; Yonghai Yue; Jiaqing He

doi:10.1007/978-981-13-0454-5_5

Spectroscopy

Zhihua Zhang^*
, Yonghai Yue
, Jiaqing He

^*Corresponding author for this work

School of Chemistry

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

Abstract

Analyzing the composition, microstructure and electronic structure of materials at the atomic/nanoscale is key issues for material science, which provides the information necessary for correlating the microstructures and the measured chemical and physical properties of a solid specimen. Energy-dispersive X-ray spectroscopy (EDS) and Electron energy-loss spectroscopy (EELS) are two important techniques for determining the structure and/or chemical composition of a solid. Benefited from the development of electron microscope, the application of EDS and EELS is growing rapidly worldwide.

Original language	English
Title of host publication	Springer Tracts in Modern Physics
Publisher	Springer Verlag
Pages	255-299
Number of pages	45
DOIs	https://doi.org/10.1007/978-981-13-0454-5_5
State	Published - 2018

Publication series

Name	Springer Tracts in Modern Physics
Volume	272
ISSN (Print)	0081-3869

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10.1007/978-981-13-0454-5_5

Cite this

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Spectroscopy

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