Sparse representation in electrical resistance tomography based on extended sensitivity matrix

Jiamin Ye; Haigang Wang; Guizhi Qiu; Wuqiang Yang

doi:10.1109/IST.2014.6958443

Sparse representation in electrical resistance tomography based on extended sensitivity matrix

Jiamin Ye
, Haigang Wang
, Guizhi Qiu
, Wuqiang Yang

CAS - Institute of Engineering Thermophysics
University of Manchester

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

5 Scopus citations

Abstract

Electrical resistance tomography is a soft-field tomography technique, i.e. the electrical field is changed everywhere in the sensing area with the change of conductivity in any pixel. To improve the image quality, an extended sensitivity matrix is designed in this paper. The base conductivity elements in the extended sensitivity matrix are consisted of a series of blocks with different number of pixels at all possible locations in the sensing region. Based on the new sensitivity matrix, a sparse representation method is implemented to reconstruct the conductivity distribution of cross-sectional area. Simulation results show that the proposed method based on the extended sensitivity matrix can reconstruct the image with a high quality.

Original language	English
Title of host publication	IST 2014 - 2014 IEEE International Conference on Imaging Systems and Techniques, Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	43-47
Number of pages	5
ISBN (Electronic)	9781479967483
DOIs	https://doi.org/10.1109/IST.2014.6958443
State	Published - 14 Nov 2014
Externally published	Yes
Event	2014 IEEE International Conference on Imaging Systems and Techniques, IST 2014 - Santorini Island, Greece Duration: 14 Oct 2014 → 17 Oct 2014

Publication series

Name	IST 2014 - 2014 IEEE International Conference on Imaging Systems and Techniques, Proceedings

Conference

Conference	2014 IEEE International Conference on Imaging Systems and Techniques, IST 2014
Country/Territory	Greece
City	Santorini Island
Period	14/10/14 → 17/10/14

Keywords

electrical resistance tomography
image reconstruction
resistance sensor

Access to Document

10.1109/IST.2014.6958443

Cite this

Ye, J., Wang, H., Qiu, G., & Yang, W. (2014). Sparse representation in electrical resistance tomography based on extended sensitivity matrix. In IST 2014 - 2014 IEEE International Conference on Imaging Systems and Techniques, Proceedings (pp. 43-47). Article 6958443 (IST 2014 - 2014 IEEE International Conference on Imaging Systems and Techniques, Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IST.2014.6958443

Ye, Jiamin ; Wang, Haigang ; Qiu, Guizhi et al. / Sparse representation in electrical resistance tomography based on extended sensitivity matrix. IST 2014 - 2014 IEEE International Conference on Imaging Systems and Techniques, Proceedings. Institute of Electrical and Electronics Engineers Inc., 2014. pp. 43-47 (IST 2014 - 2014 IEEE International Conference on Imaging Systems and Techniques, Proceedings).

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title = "Sparse representation in electrical resistance tomography based on extended sensitivity matrix",

abstract = "Electrical resistance tomography is a soft-field tomography technique, i.e. the electrical field is changed everywhere in the sensing area with the change of conductivity in any pixel. To improve the image quality, an extended sensitivity matrix is designed in this paper. The base conductivity elements in the extended sensitivity matrix are consisted of a series of blocks with different number of pixels at all possible locations in the sensing region. Based on the new sensitivity matrix, a sparse representation method is implemented to reconstruct the conductivity distribution of cross-sectional area. Simulation results show that the proposed method based on the extended sensitivity matrix can reconstruct the image with a high quality.",

keywords = "electrical resistance tomography, image reconstruction, resistance sensor",

author = "Jiamin Ye and Haigang Wang and Guizhi Qiu and Wuqiang Yang",

note = "Publisher Copyright: {\textcopyright} 2014 IEEE.; 2014 IEEE International Conference on Imaging Systems and Techniques, IST 2014 ; Conference date: 14-10-2014 Through 17-10-2014",

year = "2014",

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doi = "10.1109/IST.2014.6958443",

language = "英语",

series = "IST 2014 - 2014 IEEE International Conference on Imaging Systems and Techniques, Proceedings",

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Ye, J, Wang, H, Qiu, G & Yang, W 2014, Sparse representation in electrical resistance tomography based on extended sensitivity matrix. in IST 2014 - 2014 IEEE International Conference on Imaging Systems and Techniques, Proceedings., 6958443, IST 2014 - 2014 IEEE International Conference on Imaging Systems and Techniques, Proceedings, Institute of Electrical and Electronics Engineers Inc., pp. 43-47, 2014 IEEE International Conference on Imaging Systems and Techniques, IST 2014, Santorini Island, Greece, 14/10/14. https://doi.org/10.1109/IST.2014.6958443

Sparse representation in electrical resistance tomography based on extended sensitivity matrix. / Ye, Jiamin; Wang, Haigang; Qiu, Guizhi et al.
IST 2014 - 2014 IEEE International Conference on Imaging Systems and Techniques, Proceedings. Institute of Electrical and Electronics Engineers Inc., 2014. p. 43-47 6958443 (IST 2014 - 2014 IEEE International Conference on Imaging Systems and Techniques, Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Sparse representation in electrical resistance tomography based on extended sensitivity matrix

AU - Ye, Jiamin

AU - Wang, Haigang

AU - Qiu, Guizhi

AU - Yang, Wuqiang

PY - 2014/11/14

Y1 - 2014/11/14

N2 - Electrical resistance tomography is a soft-field tomography technique, i.e. the electrical field is changed everywhere in the sensing area with the change of conductivity in any pixel. To improve the image quality, an extended sensitivity matrix is designed in this paper. The base conductivity elements in the extended sensitivity matrix are consisted of a series of blocks with different number of pixels at all possible locations in the sensing region. Based on the new sensitivity matrix, a sparse representation method is implemented to reconstruct the conductivity distribution of cross-sectional area. Simulation results show that the proposed method based on the extended sensitivity matrix can reconstruct the image with a high quality.

AB - Electrical resistance tomography is a soft-field tomography technique, i.e. the electrical field is changed everywhere in the sensing area with the change of conductivity in any pixel. To improve the image quality, an extended sensitivity matrix is designed in this paper. The base conductivity elements in the extended sensitivity matrix are consisted of a series of blocks with different number of pixels at all possible locations in the sensing region. Based on the new sensitivity matrix, a sparse representation method is implemented to reconstruct the conductivity distribution of cross-sectional area. Simulation results show that the proposed method based on the extended sensitivity matrix can reconstruct the image with a high quality.

KW - electrical resistance tomography

KW - image reconstruction

KW - resistance sensor

UR - https://www.scopus.com/pages/publications/84916630435

U2 - 10.1109/IST.2014.6958443

DO - 10.1109/IST.2014.6958443

M3 - 会议稿件

AN - SCOPUS:84916630435

T3 - IST 2014 - 2014 IEEE International Conference on Imaging Systems and Techniques, Proceedings

SP - 43

EP - 47

BT - IST 2014 - 2014 IEEE International Conference on Imaging Systems and Techniques, Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2014 IEEE International Conference on Imaging Systems and Techniques, IST 2014

Y2 - 14 October 2014 through 17 October 2014

ER -

Ye J, Wang H, Qiu G, Yang W. Sparse representation in electrical resistance tomography based on extended sensitivity matrix. In IST 2014 - 2014 IEEE International Conference on Imaging Systems and Techniques, Proceedings. Institute of Electrical and Electronics Engineers Inc. 2014. p. 43-47. 6958443. (IST 2014 - 2014 IEEE International Conference on Imaging Systems and Techniques, Proceedings). doi: 10.1109/IST.2014.6958443

Sparse representation in electrical resistance tomography based on extended sensitivity matrix

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