TY - GEN
T1 - Source Equivalent Modeling Method in Conducted Susceptibility Testing
AU - Wang, Han
AU - Li, Weijuan
AU - Xing, Jiayue
AU - Li, Bing
N1 - Publisher Copyright:
© 2025 Applied Computational Electromagnetics Society.
PY - 2025
Y1 - 2025
N2 - During conducted susceptibility testing using the bulk current injection (BCI) method, the position of the injection probe significantly impacts the magnitude of the induced current at the port of the device under test (DUT). To precisely quantify probe effects, establishing its equivalent model is essential. Existing models typically characterize the probe and cable independently and overlook the connection of the line impedance stabilization network (LISN) in practical test setups. Building upon current probe modeling methodologies, this paper proposes a simplified calibration fixture design and innovatively constructs a unified equivalent source model integrating the injection probe, coupling cable, and LISN. This approach overcomes the limitations of separate characterization, better aligns with real-world testing scenarios, and establishes a modeling foundation for accurately determining the induced current at the DUT port.
AB - During conducted susceptibility testing using the bulk current injection (BCI) method, the position of the injection probe significantly impacts the magnitude of the induced current at the port of the device under test (DUT). To precisely quantify probe effects, establishing its equivalent model is essential. Existing models typically characterize the probe and cable independently and overlook the connection of the line impedance stabilization network (LISN) in practical test setups. Building upon current probe modeling methodologies, this paper proposes a simplified calibration fixture design and innovatively constructs a unified equivalent source model integrating the injection probe, coupling cable, and LISN. This approach overcomes the limitations of separate characterization, better aligns with real-world testing scenarios, and establishes a modeling foundation for accurately determining the induced current at the DUT port.
KW - Bulk current injection
KW - Conducted susceptibility
KW - Equivalent source model
UR - https://www.scopus.com/pages/publications/105034644960
U2 - 10.23919/ACES-China66523.2025.11332784
DO - 10.23919/ACES-China66523.2025.11332784
M3 - 会议稿件
AN - SCOPUS:105034644960
T3 - 2025 International Applied Computational Electromagnetics Society Symposium, ACES-China 2025 - Proceedings
BT - 2025 International Applied Computational Electromagnetics Society Symposium, ACES-China 2025 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2025 International Applied Computational Electromagnetics Society Symposium, ACES-China 2025
Y2 - 8 August 2025 through 11 August 2025
ER -