Abstract
Creep deformation at intermediate temperatures and high-stress conditions in a second-generation Ni-based superalloys occurs by continuous shearing of γ and γ' phases that lead to the formation of a high number density of stacking faults (SFs). Solute segregations to these faults highlight that their diffusivities play a critical role as creep rate limiting solutes. Although most of the earlier works focus on solute segregations to SFs inside γ', in this work, we show evidence of Re and W segregation at the SFs in the γ matrix phase by atomic-scale analysis using atom probe tomography. Based on the observations, we derive possible solute diffusion mechanisms along the SFs that contribute to a new understanding of creep deformation and their dependence on the specific solutes, especially Re and W in the alloy.
| Original language | English |
|---|---|
| Article number | 116065 |
| Journal | Scripta Materialia |
| Volume | 246 |
| DOIs | |
| State | Published - 1 Jun 2024 |
Keywords
- Atom probe tomography
- Ni-based single crystal superalloys
- Solute enrichment
- Superlattice stacking fault
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