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Software reliability accelerated testing method based on test coverage

  • Shuanqi Wang*
  • , Yumei Wu
  • , Minyan Lu
  • , Haifeng Li
  • *Corresponding author for this work
  • Beihang University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In order to increase the effectiveness and efficiency of software reliability testing, an accelerated testing method based on test coverage is presented in this paper. The amount of reliability test cases is reduced by a heuristic test-suite reduction algorithm based on static analysis of test coverage. The testing process is accelerated by the strategy of not executing redundant test cases and compensating their ex ecution time. The corresponding software reliability accelerated testing (SRAT) process is proposed. Also a novel two-dimensional NHPP software reliability growth model (SRGM) depending on testing time and test coverage simultaneously is developed to describe software reliability growth phenomenon in the SRAT process. The estimation method of its parameters is discussed. Finally the verification work using a case study has also been done and is introduced. Some conventional SRGMs including GO, MO and Yamada-Ohba-Osaki models are used as comparisons. Results of the experiment demonstrate clearly that the accelerated method can accelerate the reliability testing process dramatically and the proposed model is able to conduct feasible and accurate reliability assessment. Their feasibility and effectiveness are verified.

Original languageEnglish
Title of host publication2011 Proceedings - Annual Reliability and Maintainability Symposium, RAMS 2011
DOIs
StatePublished - 2011
EventAnnual Reliability and Maintainability Symposium, RAMS 2011 - Lake Buena Vista, FL, United States
Duration: 24 Jan 201127 Jan 2011

Publication series

NameProceedings - Annual Reliability and Maintainability Symposium
ISSN (Print)0149-144X

Conference

ConferenceAnnual Reliability and Maintainability Symposium, RAMS 2011
Country/TerritoryUnited States
CityLake Buena Vista, FL
Period24/01/1127/01/11

Keywords

  • software reliability accelerated testing
  • software reliability model
  • test coverage

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