TY - GEN
T1 - SLD constant-stress ADT data analysis based on time series method
AU - Wang, Li
AU - Li, Xiaoyang
AU - Jiang, Tongmin
AU - Wan, Bo
PY - 2009
Y1 - 2009
N2 - Constant Stress Accelerated Degradation Testing (CSADT) is commonly used to evaluate the lifetime of long lifetime and high reliable products, such as Super Luminescent Diode (SLD). Previous works on CSADT use deterministic function to describe the product degradation and they are not considered adequately. This paper proposes a CSADT data analysis method based on time series method. It proposes a time series modeling procedure to model product performance degradation data. An example of SLD CASDT is given as an application of the modeling technique and the estimation method is presented.
AB - Constant Stress Accelerated Degradation Testing (CSADT) is commonly used to evaluate the lifetime of long lifetime and high reliable products, such as Super Luminescent Diode (SLD). Previous works on CSADT use deterministic function to describe the product degradation and they are not considered adequately. This paper proposes a CSADT data analysis method based on time series method. It proposes a time series modeling procedure to model product performance degradation data. An example of SLD CASDT is given as an application of the modeling technique and the estimation method is presented.
KW - Constant stress accelerated degradation testing (CSADT)
KW - Super Luminescent Diode (SLD)
KW - Time series analysis
UR - https://www.scopus.com/pages/publications/77955946411
U2 - 10.1109/ICRMS.2009.5270019
DO - 10.1109/ICRMS.2009.5270019
M3 - 会议稿件
AN - SCOPUS:77955946411
SN - 9781424449057
T3 - Proceedings of 2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009
SP - 1313
EP - 1317
BT - Proceedings of 2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009
T2 - 2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009
Y2 - 20 July 2009 through 24 July 2009
ER -