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Single-Shot Characterization of Elliptically Polarized Light via Vortex-PDI Module

  • Bei Zhang*
  • , Chenning Shan
  • , Qiushi Zhang
  • , Le Wang
  • *Corresponding author for this work
  • Beihang University
  • Wuhan Kediao Electric Power Technology Company Ltd.
  • Renmin University of China

Research output: Contribution to journalArticlepeer-review

Abstract

The vortex polarization direction indicator (Vortex-PDI), comprising a half-wave vortex retarder and an analyzer, enables single-shot characterization of linearly polarized light. This study extends its application to elliptically polarized light, demonstrating single-shot measurement capabilities for: 1) orientation angle visualization and 2) simultaneous ellipticity quantification. We establish the measurement principles, algorithms, and experimental validations. A dedicated section details the characterization framework using two key parameters: degree of linear polarization (DoLP) and degree of circular polarization (DoCP). To our knowledge, this work presents the first vortex retarder-based single-shot characterization of elliptically polarized light, achieving high accuracy without mechanical or electromagnetic rotation. Detailed accuracy analysis for linear and circular polarization extremes are provided. Laser sources are not recommended due to coherent noise; narrow-band LEDs serve as viable alternatives, as substantiated in our analysis.

Original languageEnglish
Article number7011209
JournalIEEE Transactions on Instrumentation and Measurement
Volume74
DOIs
StatePublished - 2025

Keywords

  • Characterization
  • elliptical polarization
  • ellipticity
  • orientation angle
  • vortex retarder

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