Single-cell level investigation of microbiologically induced degradation of passive film of stainless steel via FIB-SEM/TEM and multi-mode AFM

Tianyu Cui; Hongchang Qian; Yuntian Lou; Xudong Chen; Tong Sun; Dawei Zhang; Xiaogang Li

doi:10.1016/j.corsci.2022.110543

Single-cell level investigation of microbiologically induced degradation of passive film of stainless steel via FIB-SEM/TEM and multi-mode AFM

Tianyu Cui
, Hongchang Qian^*
, Yuntian Lou
, Xudong Chen
, Tong Sun
, Dawei Zhang
, Xiaogang Li

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

35 Scopus citations

Abstract

The degradation of passive films of a stainless steel by S. algae was investigated at the single-cell level. The focused ion beam-scanning/transmission electron microscopy showed that the passive film underneath the adherent S. algae cell was significantly thinner than that without bacterial coverage after 3 days of inoculation. Atomic force microscopy (AFM) in the nano manipulation mode was used to move the bacterial cell and AFM in the dynamic mode revealed the nanoscale corrosion pit underneath. Peak force tapping-frequency modulation mode of AFM showed high Volta potentials at the pit center and low Volta potentials around the bacterial cell.

Original language	English
Article number	110543
Journal	Corrosion Science
Volume	206
DOIs	https://doi.org/10.1016/j.corsci.2022.110543
State	Published - Sep 2022
Externally published	Yes

Keywords

Atomic, Force microscopy
Focused ion beam
Microbiologically influenced corrosion
Stainless steels

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10.1016/j.corsci.2022.110543

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@article{729c3153574a44089d951da092c91d6a,

title = "Single-cell level investigation of microbiologically induced degradation of passive film of stainless steel via FIB-SEM/TEM and multi-mode AFM",

abstract = "The degradation of passive films of a stainless steel by S. algae was investigated at the single-cell level. The focused ion beam-scanning/transmission electron microscopy showed that the passive film underneath the adherent S. algae cell was significantly thinner than that without bacterial coverage after 3 days of inoculation. Atomic force microscopy (AFM) in the nano manipulation mode was used to move the bacterial cell and AFM in the dynamic mode revealed the nanoscale corrosion pit underneath. Peak force tapping-frequency modulation mode of AFM showed high Volta potentials at the pit center and low Volta potentials around the bacterial cell.",

keywords = "Atomic, Force microscopy, Focused ion beam, Microbiologically influenced corrosion, Stainless steels",

author = "Tianyu Cui and Hongchang Qian and Yuntian Lou and Xudong Chen and Tong Sun and Dawei Zhang and Xiaogang Li",

note = "Publisher Copyright: {\textcopyright} 2022",

year = "2022",

month = sep,

doi = "10.1016/j.corsci.2022.110543",

language = "英语",

volume = "206",

journal = "Corrosion Science",

issn = "0010-938X",

publisher = "Elsevier Ltd",

}

TY - JOUR

T1 - Single-cell level investigation of microbiologically induced degradation of passive film of stainless steel via FIB-SEM/TEM and multi-mode AFM

AU - Cui, Tianyu

AU - Qian, Hongchang

AU - Lou, Yuntian

AU - Chen, Xudong

AU - Sun, Tong

AU - Zhang, Dawei

AU - Li, Xiaogang

PY - 2022/9

Y1 - 2022/9

N2 - The degradation of passive films of a stainless steel by S. algae was investigated at the single-cell level. The focused ion beam-scanning/transmission electron microscopy showed that the passive film underneath the adherent S. algae cell was significantly thinner than that without bacterial coverage after 3 days of inoculation. Atomic force microscopy (AFM) in the nano manipulation mode was used to move the bacterial cell and AFM in the dynamic mode revealed the nanoscale corrosion pit underneath. Peak force tapping-frequency modulation mode of AFM showed high Volta potentials at the pit center and low Volta potentials around the bacterial cell.

AB - The degradation of passive films of a stainless steel by S. algae was investigated at the single-cell level. The focused ion beam-scanning/transmission electron microscopy showed that the passive film underneath the adherent S. algae cell was significantly thinner than that without bacterial coverage after 3 days of inoculation. Atomic force microscopy (AFM) in the nano manipulation mode was used to move the bacterial cell and AFM in the dynamic mode revealed the nanoscale corrosion pit underneath. Peak force tapping-frequency modulation mode of AFM showed high Volta potentials at the pit center and low Volta potentials around the bacterial cell.

KW - Atomic, Force microscopy

KW - Focused ion beam

KW - Microbiologically influenced corrosion

KW - Stainless steels

UR - https://www.scopus.com/pages/publications/85134999822

U2 - 10.1016/j.corsci.2022.110543

DO - 10.1016/j.corsci.2022.110543

M3 - 文章

AN - SCOPUS:85134999822

SN - 0010-938X

VL - 206

JO - Corrosion Science

JF - Corrosion Science

M1 - 110543

ER -

Single-cell level investigation of microbiologically induced degradation of passive film of stainless steel via FIB-SEM/TEM and multi-mode AFM

Abstract

Keywords

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