ShapeRef: A Representation Method of Industrial Abnormal Time-Series Waveform Based on Shape Reference

  • Lin Shi
  • , Chang You Zhang*
  • , Shuai Yang
  • , Wen Jia Wu
  • , Wen Bo
  • , Ji Ma
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Time-series waveform data widely exist in various industrial fields, such as equipment monitoring and fault diagnosis. The current time series representation methods have limitations when dealing with industrial abnormal time-series waveforms, such as limited applicability, semantic ambiguity, and time distortion. This work proposes a novel shape reference-based representation method for industrial abnormal time-series waveform (ShapeRef), which takes the shape of the standard waveform as a reference to represent the anomaly deviation. Specifically, ShapeRef first establishes a time-series shape reference frame, then proposes the minimum shape difference-based mapping method to describe the mapping process of coordinates, and finally reduces multi-intersection points in the mapping process to achieve uniform mapping of the abnormal time-series waveform. Experimental results show that ShapeRef can effectively represent abnormal time-series waveforms and outperforms several baseline methods in the clustering task of a real industrial equipment waveform dataset. This work enhances the accuracy and reliability of industrial equipment monitoring and fault diagnosis, which could have significant practical implications.

Original languageEnglish
Title of host publication2023 IEEE International Conference on Systems, Man, and Cybernetics
Subtitle of host publicationImproving the Quality of Life, SMC 2023 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages578-583
Number of pages6
ISBN (Electronic)9798350337020
DOIs
StatePublished - 2023
Externally publishedYes
Event2023 IEEE International Conference on Systems, Man, and Cybernetics, SMC 2023 - Hybrid, Honolulu, United States
Duration: 1 Oct 20234 Oct 2023

Publication series

NameConference Proceedings - IEEE International Conference on Systems, Man and Cybernetics
ISSN (Print)1062-922X

Conference

Conference2023 IEEE International Conference on Systems, Man, and Cybernetics, SMC 2023
Country/TerritoryUnited States
CityHybrid, Honolulu
Period1/10/234/10/23

Keywords

  • abnormal deviation
  • clustering
  • industrial time-series waveform
  • shape reference
  • time series representation

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