Semi-physical simulation test for micro CMOS star sensor

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A designed star sensor must be extensively tested before launching. Testing star sensor requires complicated process with much time and resources input. Even observing sky on the ground is a challenging and time-consuming job, requiring complicated and expensive equipments, suitable time and location, and prone to be interfered by weather. And moreover, not all stars distributed on the sky can be observed by this testing method. Semi-physical simulation in laboratory reduces the testing cost and helps to debug, analyze and evaluate the star sensor system while developing the model. The test system is composed of optical platform, star field simulator, star field simulator computer, star sensor and the central data processing computer. The test system simulates the starlight with high accuracy and good parallelism, and creates static or dynamic image in FOV (Field of View). The conditions of the test are close to observing real sky. With this system, the test of a micro star tracker designed by Beijing University of Aeronautics and Astronautics has been performed successfully. Some indices including full-sky autonomous star identification time, attitude update frequency and attitude precision etc. meet design requirement of the star sensor. Error source of the testing system is also analyzed. It is concluded that the testing system is cost-saving, efficient, and contributes to optimizing the embed arithmetic, shortening the development cycle and improving engineering design processes.

Original languageEnglish
Title of host publicationInternational Symposium on Photoelectronic Detection and Imaging 2007 - Laser, Ultraviolet, and Terahertz Technology
DOIs
StatePublished - 2008
EventInternational Symposium on Photoelectronic Detection and Imaging 2007 - Laser, Ultraviolet, and Terahertz Technology - Beijing, China
Duration: 9 Sep 200712 Sep 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6622
ISSN (Print)0277-786X

Conference

ConferenceInternational Symposium on Photoelectronic Detection and Imaging 2007 - Laser, Ultraviolet, and Terahertz Technology
Country/TerritoryChina
CityBeijing
Period9/09/0712/09/07

Keywords

  • Laboratory test system
  • Star identification
  • Star map emulation
  • Star sensor

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