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Scanning electrochemical microscopy study on the electrochemical behavior of CrN film formed on 304 stainless steel by magnetron sputtering

  • Shujun Gao
  • , Chaofang Dong*
  • , Hong Luo
  • , Kui Xiao
  • , Xiaoming Pan
  • , Xiaogang Li
  • *Corresponding author for this work
  • University of Science and Technology Beijing
  • Hohai University

Research output: Contribution to journalArticlepeer-review

Abstract

The electrochemical behavior of CrN film formed on 304 stainless steel (304 SS) by magnetron sputtering was investigated by scanning electrochemical microscopy (SECM) in redox competition mode and X-ray photoelectron spectroscopy (XPS) in 0.2 M H3BO3 + 0.05 M Na2B 4O7 (pH = 8.4) buffer solution containing 3.5 wt% NaCl. The results demonstrated that passive film could form on the surface of CrN film with the chemical compositions of Cr, Cr2O3, CrN, Cr(OH)3, and CrO3. When applied with 0.9 vs SCE/V potential, the pitting propagation sites corresponded to the high oxygen consumption region. While above stable pit, the Pt microelectrode showed an enhanced faradic current. Separated anodes and cathodes were observed in the scratch, which suggested that the dominant corrosion mechanism is pitting corrosion induced and promoted by galvanic corrosion. These results provide a more explicit description of the corrosion mechanism and processes of CrN film.

Original languageEnglish
Pages (from-to)233-241
Number of pages9
JournalElectrochimica Acta
Volume114
DOIs
StatePublished - 2013
Externally publishedYes

Keywords

  • CrN
  • Electrochemical behavior
  • Redox competition mode
  • SECM

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