TY - GEN
T1 - Root Causes Identification Approach Based on Association Rule Mining for Product Infant Failure
AU - He, Zhenzhen
AU - He, Yihai
AU - Wang, Lingbo
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2016/5/11
Y1 - 2016/5/11
N2 - The high infant failure rate is a long-standing problem for complex engineering products, the studies about the infant failure mechanism still remain in its infancy which only depending on burn-in tests or failure rate estimations, these remedies, though, are palliatives. In order to resolve this dilemma, in view of the theory of big data and data mining, an approach based on association rule mining to identify the product infant failure root causes is proposed in this paper. Firstly, the connotation of product infant failure mechanism is summarized in the life-cycle view, and the root causes of product infant failure are expressed based on the domain mapping theory in axiomatic design, Secondly, the root causes of product infant failure are represented in the form of failure relational tree, and the association relationships are clarified also. The failure relation weight is mined based on the information entropy principles of association rule. Finally, the validity of the proposed method is verified by a case study of analyzing a computer board electricity infant failure, and the result shown that the proposed approach is conducive to identify the product infant failure root causes in the big data circumstances.
AB - The high infant failure rate is a long-standing problem for complex engineering products, the studies about the infant failure mechanism still remain in its infancy which only depending on burn-in tests or failure rate estimations, these remedies, though, are palliatives. In order to resolve this dilemma, in view of the theory of big data and data mining, an approach based on association rule mining to identify the product infant failure root causes is proposed in this paper. Firstly, the connotation of product infant failure mechanism is summarized in the life-cycle view, and the root causes of product infant failure are expressed based on the domain mapping theory in axiomatic design, Secondly, the root causes of product infant failure are represented in the form of failure relational tree, and the association relationships are clarified also. The failure relation weight is mined based on the information entropy principles of association rule. Finally, the validity of the proposed method is verified by a case study of analyzing a computer board electricity infant failure, and the result shown that the proposed approach is conducive to identify the product infant failure root causes in the big data circumstances.
KW - association rule mining
KW - domain mapping
KW - failure relational tree
KW - infant failure mechanism
KW - root cause
UR - https://www.scopus.com/pages/publications/84978063169
U2 - 10.1109/ISCID.2015.247
DO - 10.1109/ISCID.2015.247
M3 - 会议稿件
AN - SCOPUS:84978063169
T3 - Proceedings - 2015 8th International Symposium on Computational Intelligence and Design, ISCID 2015
SP - 624
EP - 628
BT - Proceedings - 2015 8th International Symposium on Computational Intelligence and Design, ISCID 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 8th International Symposium on Computational Intelligence and Design, ISCID 2015
Y2 - 12 December 2015 through 13 December 2015
ER -