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Robust Spectral Learning for Unsupervised Feature Selection

  • CAS - Institute of Software
  • University of Chinese Academy of Sciences

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper, we consider the problem of unsupervised feature selection. Recently, spectral feature selection algorithms, which leverage both graph Laplacian and spectral regression, have received increasing attention. However, existing spectral feature selection algorithms suffer from two major problems: 1) since the graph Laplacian is constructed from the original feature space, noisy and irrelevant features may have adverse effect on the estimated graph Laplacian and hence degenerate the quality of the induced graph embedding, 2) since the cluster labels are discrete in natural, relaxing and approximating these labels into a continuous embedding can inevitably introduce noise into the estimated cluster labels. Without considering the noise in the cluster labels, the feature selection process may be misguided. In this paper, we propose a Robust Spectral learning framework for unsupervised Feature Selection (RSFS), which jointly improves the robustness of graph embedding and sparse spectral regression. Compared with existing methods which are sensitive to noisy features, our proposed method utilizes a robust local learning method to construct the graph Laplacian and a robust spectral regression method to handle the noise on the learned cluster labels. In order to solve the proposed optimization problem, an efficient iterative algorithm is proposed. We also show the close connection between the proposed robust spectral regression and robust Huber M-estimator. Experimental results on different datasets show the superiority of RSFS.

Original languageEnglish
Title of host publicationProceedings - 14th IEEE International Conference on Data Mining, ICDM 2014
EditorsRavi Kumar, Hannu Toivonen, Jian Pei, Joshua Zhexue Huang, Xindong Wu
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages977-982
Number of pages6
EditionJanuary
ISBN (Electronic)9781479943029
DOIs
StatePublished - 1 Jan 2014
Externally publishedYes
Event14th IEEE International Conference on Data Mining, ICDM 2014 - Shenzhen, China
Duration: 14 Dec 201417 Dec 2014

Publication series

NameProceedings - IEEE International Conference on Data Mining, ICDM
NumberJanuary
Volume2015-January
ISSN (Print)1550-4786

Conference

Conference14th IEEE International Conference on Data Mining, ICDM 2014
Country/TerritoryChina
CityShenzhen
Period14/12/1417/12/14

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