Review on reflectance acquisition and modeling techniques of opaque materials

The complex and rich optic phenomena of real-world material can be represented by reflectance model in computer graphics and computer vision domain. Due to the high dimension and rich variation feature of the model, the acquisition and modeling techniques of reflectance data become a hot and challenging topic. The latest progress at home and abroad on the acquisition and modeling techniques of opaque material is introduced in the paper, and analysis and summary to the topic are also given. Finally, some existing challenges and future development trends in this domain are highlighted.