Review on measuring technologies for thermal characteristics of semiconductor lasers

Mingwei Yang; Yuanhong Yang

Review on measuring technologies for thermal characteristics of semiconductor lasers

Mingwei Yang^*
, Yuanhong Yang

^*Corresponding author for this work

School of Instrumentation and Optoelectronic Engineering

Beihang University

Research output: Contribution to journal › Review article › peer-review

2 Scopus citations

Abstract

Technologies used for measuring the thermal characteristics of semiconductor lasers were discussed. Their basic principles, advantages and disadvantages were presented.

Original language	English
Pages (from-to)	834-837+944
Journal	Bandaoti Guangdian/Semiconductor Optoelectronics
Volume	31
Issue number	6
State	Published - Dec 2010

Keywords

Semiconductor laser
Temperature rise
Thermal characteristic

Cite this

@article{22204cf5edaa424f857bec1a3d7d0408,

title = "Review on measuring technologies for thermal characteristics of semiconductor lasers",

abstract = "Technologies used for measuring the thermal characteristics of semiconductor lasers were discussed. Their basic principles, advantages and disadvantages were presented.",

keywords = "Semiconductor laser, Temperature rise, Thermal characteristic",

author = "Mingwei Yang and Yuanhong Yang",

year = "2010",

month = dec,

language = "英语",

volume = "31",

pages = "834--837+944",

journal = "Bandaoti Guangdian/Semiconductor Optoelectronics",

issn = "1001-5868",

publisher = "China National Publishing Industry Trading Corporation",

number = "6",

}

TY - JOUR

T1 - Review on measuring technologies for thermal characteristics of semiconductor lasers

AU - Yang, Mingwei

AU - Yang, Yuanhong

PY - 2010/12

Y1 - 2010/12

N2 - Technologies used for measuring the thermal characteristics of semiconductor lasers were discussed. Their basic principles, advantages and disadvantages were presented.

AB - Technologies used for measuring the thermal characteristics of semiconductor lasers were discussed. Their basic principles, advantages and disadvantages were presented.

KW - Semiconductor laser

KW - Temperature rise

KW - Thermal characteristic

UR - https://www.scopus.com/pages/publications/79851477232

M3 - 文献综述

AN - SCOPUS:79851477232

SN - 1001-5868

VL - 31

SP - 834-837+944

JO - Bandaoti Guangdian/Semiconductor Optoelectronics

JF - Bandaoti Guangdian/Semiconductor Optoelectronics

IS - 6

ER -

Review on measuring technologies for thermal characteristics of semiconductor lasers

Abstract

Keywords

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