@inproceedings{59adf768666c442787bff1e4649d9db5,
title = "Research on the design and application of test circuits for a digital voltmeter",
abstract = "By providing a typical A/D circuit based on ICL7135 4-1/2 digit voltmeter, the paper focuses on the design of fault test circuit. The principle of digital voltmeter circuit and the main circuit failure modes and mechanisms with FMMEA will be presented, additional new test circuit designs will be demonstrated in the original A/D circuit and the feasibility will be analyzed and clarified. Finally, recommendations and some methods to design test circuit for a few main failure modes will be proposed.",
keywords = "Digital voltmeter, FMMEA, ICL7135, Test circuit design",
author = "Hao Chen and Weiwei Hu and Junliang Li",
note = "Publisher Copyright: {\textcopyright} 2015 Taylor \& Francis Group, London.; 2014 International Conference on Future Information Engineering and Manufacturing Science, FIEMS 2014 ; Conference date: 26-06-2014 Through 27-06-2014",
year = "2015",
language = "英语",
series = "Future Information Engineering and Manufacturing Science - Proceedings of the 2014 International Conference on Future Information Engineering and Manufacturing Science, FIEMS 2014",
publisher = "CRC Press/Balkema",
pages = "87--90",
editor = "Dawei Zheng",
booktitle = "Future Information Engineering and Manufacturing Science - Proceedings of the 2014 International Conference on Future Information Engineering and Manufacturing Science, FIEMS 2014",
}