Research on test adapter framework for distributed TTCN-3 test execution platform

  • Guan Wang*
  • , Ji Wu
  • , Luo Xu
  • , Mao Zhong Jin
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Because distributed system had features of physical distribution, simultaneous access, being sensitive to sequence and platform isomerism, distributed test system must fit those features. TTCN-3 distributed test execution platform was able to fulfill requirements of distributes test. However, with the feature of static binding test adapter, TTCN-3 test system can not communicate with different kinds of SUTs at a single test execution node. Therefore the concept of test adapter framework was present in this paper. On the basis of fundamental adaptation with supporting TTCN-3 standard interface, the framework integrated test adapters for different kinds of SUTs, dynamically selected and used adaptive test adapter. As a result, the framework fulfills requirements of TTCN-3 distributed test execution platform, and strengthens the ability of TTCN-3 for distributed test domain as well.

Original languageEnglish
Pages (from-to)125-130+117
JournalTien Tzu Hsueh Pao/Acta Electronica Sinica
Volume37
Issue numberSUPPL.
StatePublished - Apr 2009

Keywords

  • Distributed test
  • TTCN-3
  • TTCN-3 distributed test execution platform
  • Test adapter
  • Test adapter framework

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