TY - GEN
T1 - Research on embedded software testing data generation system
AU - Yin, Yongfeng
AU - Liu, Bin
AU - Ni, Hongying
PY - 2011
Y1 - 2011
N2 - Testing data generation system is an important guarantee for the realization of the maintainable, and effective automated testing of embedded software. In this paper, analysis of the characteristics of embedded software testing data is studied firstly. And then, the process of the embedded software testing data generation is put forward. Finally, the design and realization of the ESTDGS (embedded software testing data generation system) are described in detail. Using the layered architecture design, the user layer, function layer and data layer of ESTDGS are separated and the generated testing data is eventually stored using XML (Extensible Markup Language), which can improve the generalization, maintainability and expansibility of the system effectively.
AB - Testing data generation system is an important guarantee for the realization of the maintainable, and effective automated testing of embedded software. In this paper, analysis of the characteristics of embedded software testing data is studied firstly. And then, the process of the embedded software testing data generation is put forward. Finally, the design and realization of the ESTDGS (embedded software testing data generation system) are described in detail. Using the layered architecture design, the user layer, function layer and data layer of ESTDGS are separated and the generated testing data is eventually stored using XML (Extensible Markup Language), which can improve the generalization, maintainability and expansibility of the system effectively.
KW - Automated software testing
KW - Embedded software
KW - Software architecture
KW - Testing data
UR - https://www.scopus.com/pages/publications/78651337301
U2 - 10.4028/www.scientific.net/AMM.44-47.247
DO - 10.4028/www.scientific.net/AMM.44-47.247
M3 - 会议稿件
AN - SCOPUS:78651337301
SN - 9783037850046
T3 - Applied Mechanics and Materials
SP - 247
EP - 250
BT - Frontiers of Manufacturing and Design Science
T2 - 2010 International Conference on Frontiers of Manufacturing and Design Science, ICFMD2010
Y2 - 11 December 2010 through 12 December 2010
ER -