Research on diagnostics and prognostics of FPGA-based system

Cheng Gao; Wei Guo; Yue Sun

doi:10.1109/PHM.2012.6228798

Research on diagnostics and prognostics of FPGA-based system

Cheng Gao^*
, Wei Guo
, Yue Sun

^*Corresponding author for this work

School of Reliability and Systems Engineering

Beihang University

Research output: Contribution to conference › Paper › peer-review

Abstract

FPGAs are widely adopted in many application domains and the higher accuracy requirement of FPGA makes the diagnostics and prognostics techniques of FPGA-based system is becoming increasingly important. This paper takes the stuck-at fault of look-up table in programmable logic blocks as a research object and presents the diagnostic method based on the Built-in Self Test. Example is provided for the approach and some basic physics of failure models are given to estimate the damage to the FPGA.

Original language	English
DOIs	https://doi.org/10.1109/PHM.2012.6228798
State	Published - 2012
Event	2012 3rd Annual IEEE Prognostics and System Health Management Conference, PHM-2012 - Beijing, China Duration: 23 May 2012 → 25 May 2012

Conference

Conference	2012 3rd Annual IEEE Prognostics and System Health Management Conference, PHM-2012
Country/Territory	China
City	Beijing
Period	23/05/12 → 25/05/12

Keywords

BIST
FPGA
fault models
physics of failure

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10.1109/PHM.2012.6228798

Cite this

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title = "Research on diagnostics and prognostics of FPGA-based system",

abstract = "FPGAs are widely adopted in many application domains and the higher accuracy requirement of FPGA makes the diagnostics and prognostics techniques of FPGA-based system is becoming increasingly important. This paper takes the stuck-at fault of look-up table in programmable logic blocks as a research object and presents the diagnostic method based on the Built-in Self Test. Example is provided for the approach and some basic physics of failure models are given to estimate the damage to the FPGA.",

keywords = "BIST, FPGA, fault models, physics of failure",

author = "Cheng Gao and Wei Guo and Yue Sun",

year = "2012",

doi = "10.1109/PHM.2012.6228798",

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AU - Guo, Wei

AU - Sun, Yue

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AB - FPGAs are widely adopted in many application domains and the higher accuracy requirement of FPGA makes the diagnostics and prognostics techniques of FPGA-based system is becoming increasingly important. This paper takes the stuck-at fault of look-up table in programmable logic blocks as a research object and presents the diagnostic method based on the Built-in Self Test. Example is provided for the approach and some basic physics of failure models are given to estimate the damage to the FPGA.

KW - BIST

KW - FPGA

KW - fault models

KW - physics of failure

UR - https://www.scopus.com/pages/publications/84866144177

U2 - 10.1109/PHM.2012.6228798

DO - 10.1109/PHM.2012.6228798

M3 - 论文

AN - SCOPUS:84866144177

T2 - 2012 3rd Annual IEEE Prognostics and System Health Management Conference, PHM-2012

Y2 - 23 May 2012 through 25 May 2012

ER -

Research on diagnostics and prognostics of FPGA-based system

Abstract

Conference

Keywords

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