TY - GEN
T1 - Reliability modeling of complex mechanism system using GBN
AU - Wang, Pidong
AU - Zhang, Jianguo
AU - Yang, Lechang
AU - Kan, Linjie
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/5/8
Y1 - 2015/5/8
N2 - The Bayesian Network (BN) as a probability-based knowledge representation method is appropriate for modeling complex mechanism system reliability, when it is of interest in complex structures or multiple failure modes in the system. This paper presents a new Grey Bayesian Network (GBN) to solve the reliability problem for complex mechanism system with incomplete information and high uncertainty. In this new model, grey probability density functions (GPDF) of its nodes are obtained by grey generation theory and interval analyses instead of the ones represent random variables. The reliability of the complex mechanism is computed by the Monte Carlo simulation. Research on this method is performed by a space mechanism, and the results show the feasibility and validity of the proposed method.
AB - The Bayesian Network (BN) as a probability-based knowledge representation method is appropriate for modeling complex mechanism system reliability, when it is of interest in complex structures or multiple failure modes in the system. This paper presents a new Grey Bayesian Network (GBN) to solve the reliability problem for complex mechanism system with incomplete information and high uncertainty. In this new model, grey probability density functions (GPDF) of its nodes are obtained by grey generation theory and interval analyses instead of the ones represent random variables. The reliability of the complex mechanism is computed by the Monte Carlo simulation. Research on this method is performed by a space mechanism, and the results show the feasibility and validity of the proposed method.
KW - complex mechatronic system
KW - grey
KW - grey Bayesian network
KW - grey probability density functions
KW - partial information
UR - https://www.scopus.com/pages/publications/84945326637
U2 - 10.1109/RAMS.2015.7105087
DO - 10.1109/RAMS.2015.7105087
M3 - 会议稿件
AN - SCOPUS:84945326637
T3 - Proceedings - Annual Reliability and Maintainability Symposium
BT - RAMS 2015 - 61st Annual Reliability and Maintainability Symposium, Proceedings and Tutorials 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 61st Annual Reliability and Maintainability Symposium, RAMS 2015
Y2 - 26 January 2015 through 29 January 2015
ER -