TY - GEN
T1 - Reliability modeling method of electronic products considering failure mechanism dependence
AU - Chen, Ying
AU - Ye, Cui
AU - Zhang, Xiaoqin
AU - Kang, Rui
AU - Xue, Dan
N1 - Publisher Copyright:
© 2014 IEEE.
PY - 2014/10/7
Y1 - 2014/10/7
N2 - There are varieties of failure mechanisms in electronic product, and they show a very strong dependence between each other. Understanding and describing the dependence of failure mechanism is the basis for product reliability prediction and assessment based on physics of failure. Starting from the characteristic of failure mechanism, this paper studies the classification of failure mechanism correlations, derives the mathematical model of reliability of each single failure mechanism correlation, and studies system reliability modeling method of electronic product considering failure mechanisms dependence based on reliability block diagram. Taking a voltage protection module as example, failure correlation between different components and dependence between mechanisms in one component are both discussed, their reliability models are built, and reliability parameters of the voltage protection module are obtained eventually.
AB - There are varieties of failure mechanisms in electronic product, and they show a very strong dependence between each other. Understanding and describing the dependence of failure mechanism is the basis for product reliability prediction and assessment based on physics of failure. Starting from the characteristic of failure mechanism, this paper studies the classification of failure mechanism correlations, derives the mathematical model of reliability of each single failure mechanism correlation, and studies system reliability modeling method of electronic product considering failure mechanisms dependence based on reliability block diagram. Taking a voltage protection module as example, failure correlation between different components and dependence between mechanisms in one component are both discussed, their reliability models are built, and reliability parameters of the voltage protection module are obtained eventually.
UR - https://www.scopus.com/pages/publications/84910612737
U2 - 10.1109/CYBER.2014.6917500
DO - 10.1109/CYBER.2014.6917500
M3 - 会议稿件
AN - SCOPUS:84910612737
T3 - 4th Annual IEEE International Conference on Cyber Technology in Automation, Control and Intelligent Systems, IEEE-CYBER 2014
SP - 419
EP - 423
BT - 4th Annual IEEE International Conference on Cyber Technology in Automation, Control and Intelligent Systems, IEEE-CYBER 2014
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 4th Annual IEEE International Conference on Cyber Technology in Automation, Control and Intelligent Systems, IEEE-CYBER 2014
Y2 - 4 June 2014 through 7 June 2014
ER -