Reliability Modeling for Products Subject to Generalized Extreme Shock

Products may subject to degradation process with generalized extreme shocks. Thus, degradation processes and shock processes should be considered together in reliability analysis. When a generalized extreme shock happens, it may induce damage to products. In addition, for some complex devices, when the magnitude of shock exceeds a critical threshold, generalized extreme shock can increase the degradation rate. Existing work on degradation modeling consider effects of stress levels on degradation rate of product performance, and most only focus on the damage caused by shocks. According to existing work, a model considering the effect of generalized extreme shock on degradation rate is presented, and the degradation model is established based on a generalized extreme shock function and a changing degradation rate function together with a Wiener process to model the stochastic degradation process. A simulation experiment is proposed to verify the application of the model, and a case study for miniature bulbs is used to verify the effectiveness and practicality of the proposed model.