TY - GEN
T1 - Reliability modeling for multi-component systems subject to multiple dependent competing failure processes with shifting hard failure threshold
AU - Guan, Xiaomeng
AU - Zhao, Guangyan
AU - Xuan, Jie
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/10/20
Y1 - 2017/10/20
N2 - For complex multi-unit systems whose sub-unit suffering multiple dependent competing failure processes (MDCFP) with shifting hard failure threshold, new multiple-component system models were developed in this paper. The previous studies about reliability analysis have focused on a single unit or simple system with s-independent failure processes and failure times. The new models are different from previous studies by extending unit-level degradation model to the system level. In this paper, each component in the system can be invalid owing to a hard failure process or a soft failure process. These failure processes mentioned-above are not only competing but also dependent and whichever happens first, the component fails. Moreover, the hard failure threshold can change due to the increment of the total degradation. Then, the reliability models for series, parallel, series-parallel system were derived respectively. Finally, numerical examples about Micro-electro-mechanical System (MEMS) are illustrated to verify the developed models and the results are effective. These models could be applied in MEMS or used in many other similar systems.
AB - For complex multi-unit systems whose sub-unit suffering multiple dependent competing failure processes (MDCFP) with shifting hard failure threshold, new multiple-component system models were developed in this paper. The previous studies about reliability analysis have focused on a single unit or simple system with s-independent failure processes and failure times. The new models are different from previous studies by extending unit-level degradation model to the system level. In this paper, each component in the system can be invalid owing to a hard failure process or a soft failure process. These failure processes mentioned-above are not only competing but also dependent and whichever happens first, the component fails. Moreover, the hard failure threshold can change due to the increment of the total degradation. Then, the reliability models for series, parallel, series-parallel system were derived respectively. Finally, numerical examples about Micro-electro-mechanical System (MEMS) are illustrated to verify the developed models and the results are effective. These models could be applied in MEMS or used in many other similar systems.
KW - multi-component systems
KW - multiple dependent competing failure processes (MDCFP)
KW - reliability modeling
KW - shifting hard failure threshold
UR - https://www.scopus.com/pages/publications/85039926239
U2 - 10.1109/PHM.2017.8079117
DO - 10.1109/PHM.2017.8079117
M3 - 会议稿件
AN - SCOPUS:85039926239
T3 - 2017 Prognostics and System Health Management Conference, PHM-Harbin 2017 - Proceedings
BT - 2017 Prognostics and System Health Management Conference, PHM-Harbin 2017 - Proceedings
A2 - Zhang, Bin
A2 - Peng, Yu
A2 - Liao, Haitao
A2 - Liu, Datong
A2 - Wang, Shaojun
A2 - Miao, Qiang
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 8th IEEE Prognostics and System Health Management Conference, PHM-Harbin 2017
Y2 - 9 July 2017 through 12 July 2017
ER -