TY - GEN
T1 - Reliability evaluation of dcfp in k/n system considering shock threshold descending
AU - Zhu, Guixia
AU - Yang, Tianyu
AU - Chen, Ying
N1 - Publisher Copyright:
© ESREL2020-PSAM15 Organizers.Published by Research Publishing, Singapore.
PY - 2020
Y1 - 2020
N2 - In the industrial design process, redundant methods are often used to improve the reliability of the system, for example the k-out-of-n system. Also, degradation and overstress failure exist in the many systems where operation load and environmental conditions are complex. They can cause DCFP (Dependent Competing Failure Process). However, the components in k-out-of-n system often have load-sharing effects, and the failure correlation caused by them may increase the joint failure probability of the system and reduce the reliability of the system. Moreover, systems may experience the mutual effect of the degradation and catastrophic failure caused by shock because of DCFP. After considering the load sharing effect and DCFP in k-out-of-n system, system reliability evaluation becomes more difficult. This paper analyses the relationship about descending of threshold between the interaction of shock process and degradation process from failure behaviour rules. System modelling method and failure probability evaluation are based on considering the impact of load-sharing effects and DCFP in k-out-of-n system. The study considers three mechanisms of descending load threshold: 1) degradation failure threshold descending caused by random shock process; 2) shock failure threshold descending caused by random shock process; 3) shock failure threshold descending caused by degradation process. Finally, this paper studies the reliability of the system by simulating the case of a voltage regulator system by considering load-sharing effects and DCFP to evaluate the influence of threshold decrease on k-out-of-n system.
AB - In the industrial design process, redundant methods are often used to improve the reliability of the system, for example the k-out-of-n system. Also, degradation and overstress failure exist in the many systems where operation load and environmental conditions are complex. They can cause DCFP (Dependent Competing Failure Process). However, the components in k-out-of-n system often have load-sharing effects, and the failure correlation caused by them may increase the joint failure probability of the system and reduce the reliability of the system. Moreover, systems may experience the mutual effect of the degradation and catastrophic failure caused by shock because of DCFP. After considering the load sharing effect and DCFP in k-out-of-n system, system reliability evaluation becomes more difficult. This paper analyses the relationship about descending of threshold between the interaction of shock process and degradation process from failure behaviour rules. System modelling method and failure probability evaluation are based on considering the impact of load-sharing effects and DCFP in k-out-of-n system. The study considers three mechanisms of descending load threshold: 1) degradation failure threshold descending caused by random shock process; 2) shock failure threshold descending caused by random shock process; 3) shock failure threshold descending caused by degradation process. Finally, this paper studies the reliability of the system by simulating the case of a voltage regulator system by considering load-sharing effects and DCFP to evaluate the influence of threshold decrease on k-out-of-n system.
KW - Dependent competing failure process
KW - K-out-of-n system
KW - Load-sharing effects
KW - Multiple mechanism correlation
KW - Reliability assessment
KW - Threshold descending
UR - https://www.scopus.com/pages/publications/85107272366
U2 - 10.3850/978-981-14-8593-0_4105-cd
DO - 10.3850/978-981-14-8593-0_4105-cd
M3 - 会议稿件
AN - SCOPUS:85107272366
SN - 9789811485930
T3 - Proceedings of the 30th European Safety and Reliability Conference and the 15th Probabilistic Safety Assessment and Management Conference
SP - 5023
EP - 5030
BT - Proceedings of the 30th European Safety and Reliability Conference and the 15th Probabilistic Safety Assessment and Management Conference
A2 - Baraldi, Piero
A2 - Di Maio, Francesco
A2 - Zio, Enrico
PB - Research Publishing, Singapore
T2 - 30th European Safety and Reliability Conference, ESREL 2020 and 15th Probabilistic Safety Assessment and Management Conference, PSAM15 2020
Y2 - 1 November 2020 through 5 November 2020
ER -