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Reliability evaluation of dcfp in k/n system considering shock threshold descending

  • Research Institute of Nuclear Power Operation
  • Beihang University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In the industrial design process, redundant methods are often used to improve the reliability of the system, for example the k-out-of-n system. Also, degradation and overstress failure exist in the many systems where operation load and environmental conditions are complex. They can cause DCFP (Dependent Competing Failure Process). However, the components in k-out-of-n system often have load-sharing effects, and the failure correlation caused by them may increase the joint failure probability of the system and reduce the reliability of the system. Moreover, systems may experience the mutual effect of the degradation and catastrophic failure caused by shock because of DCFP. After considering the load sharing effect and DCFP in k-out-of-n system, system reliability evaluation becomes more difficult. This paper analyses the relationship about descending of threshold between the interaction of shock process and degradation process from failure behaviour rules. System modelling method and failure probability evaluation are based on considering the impact of load-sharing effects and DCFP in k-out-of-n system. The study considers three mechanisms of descending load threshold: 1) degradation failure threshold descending caused by random shock process; 2) shock failure threshold descending caused by random shock process; 3) shock failure threshold descending caused by degradation process. Finally, this paper studies the reliability of the system by simulating the case of a voltage regulator system by considering load-sharing effects and DCFP to evaluate the influence of threshold decrease on k-out-of-n system.

Original languageEnglish
Title of host publicationProceedings of the 30th European Safety and Reliability Conference and the 15th Probabilistic Safety Assessment and Management Conference
EditorsPiero Baraldi, Francesco Di Maio, Enrico Zio
PublisherResearch Publishing, Singapore
Pages5023-5030
Number of pages8
ISBN (Print)9789811485930
DOIs
StatePublished - 2020
Event30th European Safety and Reliability Conference, ESREL 2020 and 15th Probabilistic Safety Assessment and Management Conference, PSAM15 2020 - Venice, Italy
Duration: 1 Nov 20205 Nov 2020

Publication series

NameProceedings of the 30th European Safety and Reliability Conference and the 15th Probabilistic Safety Assessment and Management Conference

Conference

Conference30th European Safety and Reliability Conference, ESREL 2020 and 15th Probabilistic Safety Assessment and Management Conference, PSAM15 2020
Country/TerritoryItaly
CityVenice
Period1/11/205/11/20

Keywords

  • Dependent competing failure process
  • K-out-of-n system
  • Load-sharing effects
  • Multiple mechanism correlation
  • Reliability assessment
  • Threshold descending

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