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Reliability Assessment of Extravehicular Electric Tool Switch Buttons via the Integration of K-Means++ and Uncertain Random Accelerated Degradation Algorithms

  • Beichen He
  • , Xiaoyang Li*
  • , Rui Kang
  • , Shouqing Huang
  • , Zhaolin Zhang
  • , Hao Wang
  • , Jing Wang
  • *Corresponding author for this work
  • Beihang University
  • China Aerospace Science and Technology Corporation
  • Science & Technology on Reliability & Environmental Engineering Laboratory

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The switch button is a critical component for enabling the start-stop function of extravehicular electric tools on the space station, with its reliability directly impacting the success of extravehicular maintenance tasks. This paper investigates the performance degradation of the switch button under prolonged storage conditions through accelerated degradation tests and proposes a hybrid approach that combines the k-means ++ algorithm with an uncertain random accelerated degradation model (URADM) to assess the reliability of the switch button. Initially, the stable degradation phase of the switch button is identified using the k -means ^++ algorithm. Subsequently, the URADM is utilized for modeling and simulating degradation trajectories. Comparative analysis between simulation results and actual data validates the effectiveness of this method. Ultimately, we obtained the reliability of the switch button under the actual storage temperature.

Original languageEnglish
Title of host publicationProceedings - 2024 15th International Conference on Reliability, Maintenance and Safety, ICRMS 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1005-1010
Number of pages6
ISBN (Electronic)9798331529116
DOIs
StatePublished - 2024
Event15th International Conference on Reliability, Maintenance and Safety, ICRMS 2024 - Gulin, China
Duration: 31 Jul 20242 Aug 2024

Publication series

NameProceedings - 2024 15th International Conference on Reliability, Maintenance and Safety, ICRMS 2024

Conference

Conference15th International Conference on Reliability, Maintenance and Safety, ICRMS 2024
Country/TerritoryChina
CityGulin
Period31/07/242/08/24

Keywords

  • k-means++ algorithm
  • reliability
  • switch button
  • uncertain random accelerated degradation model

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