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Reliability Assessment of Anti-SEU Computer System with Timed Refresh and Backup Fault Tolerance

  • Beihang University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Spacecraft often fail due to single event upset (SEU) events. To enhance system reliability, a variety of anti-radiation reinforcement measures are used in combination. This paper proposes a reliability assessment method for a computer system that adopts timed refresh and backup fault tolerant measures. This method establishes a failure probability model for the SEU-prone RAM devices in computer systems by considering the state transition characteristics of the timed refresh task and the error correction rules of Hamming codes. Additionally, the Bootstrap small sample data processing method is utilized to obtain the confidence interval estimation of the failure probability. Furthermore, a dynamic fault tree is established according to various backup measures and logical architectures of the anti-SEU computer system. The reliability of the system during the mission is estimated using the Monte Carlo method. At the end of the paper, a case study is carried out. The reliability data of components or systems obtained by this method will provide a reference for designers to evaluate whether the spacecraft is operating safely in orbit.

Original languageEnglish
Title of host publication2023 Global Reliability and Prognostics and Health Management Conference, PHM-Hangzhou 2023
EditorsWei Guo, Steven Li
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350301359
DOIs
StatePublished - 2023
Event14th IEEE Global Reliability and Prognostics and Health Management Conference, PHM-Hangzhou 2023 - Hangzhou, China
Duration: 12 Oct 202315 Oct 2023

Publication series

Name2023 Global Reliability and Prognostics and Health Management Conference, PHM-Hangzhou 2023

Conference

Conference14th IEEE Global Reliability and Prognostics and Health Management Conference, PHM-Hangzhou 2023
Country/TerritoryChina
CityHangzhou
Period12/10/2315/10/23

Keywords

  • anti-SEU computer system
  • backup fault tolerance
  • RAM
  • reliability assessment
  • timed refresh

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