Reliability and failure behavior model of optoelectronic devices

Recent dramatic development of science and technology has made optoelectronic devices, a crucial pole in many sophisticated systems, more powerful, accurate and complicated than ever. As a result, the development of these optoelectronic products not only increases the complexity of their structures, but leads to increasing challenge to predict the reliability of them. Based on this situation, this paper provides an engineering method to obtain the reliability prediction of optoelectronic products. In addition, several kinds of software have to be utilized to assist with computation in the method. Pspice is used to simulate the electrical stress, Calce FAST mainly resolve life prediction problems correlating electro-mechanism individually, and MATLAB is utilized to fit the degradation curves according to enough data which have been obtained above. Finally, a system failure mechanism tree which considering each failure mechanism is established. The result of lifetime prediction of sun sensor would be obtained according to the failure mechanism tree.