@inproceedings{9671662add934986864d50209c386256,
title = "Reliability Analysis of a Small Form-factor Pluggable+ Optical Transceiver",
abstract = "Data centers expanding in size and requiring higher bandwidth and reliability. The reliability of optical transceivers, which are fundamental components of data center optical networks, has not been fully researched. This paper provides a reliability analysis of Small Form-factor Pluggable+ (SFP+) optical transceivers. The failure modes are analyzed using the Risk Priority Number (RPN) method and threat analysis matrix. An optical power test platform and an accelerated test system for SFP+ optical transceiver are constructed. Based on the results of the failure mode analysis, an accelerated degradation test was conducted on the SFP+ optical transceiver. The degradation data are analyzed using the Wiener process. The reliability function and mean time to failure (MTTF) of the SFP+ optical transceivers are evaluated under the test conditions. The MTTF is 2215.04 hours. This research can provide some reference for reliability research of optical transceivers.",
keywords = "Failure modes analysis, MTTF, SFP+ optical transceiver, Wiener process",
author = "Wei Li and Cheng Gao and Jiaoying Huang and Ziqing Ma",
note = "Publisher Copyright: {\textcopyright} 2024 IEEE.; 15th International Conference on Reliability, Maintenance and Safety, ICRMS 2024 ; Conference date: 31-07-2024 Through 02-08-2024",
year = "2024",
doi = "10.1109/ICRMS63553.2024.00063",
language = "英语",
series = "Proceedings - 2024 15th International Conference on Reliability, Maintenance and Safety, ICRMS 2024",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "355--361",
booktitle = "Proceedings - 2024 15th International Conference on Reliability, Maintenance and Safety, ICRMS 2024",
address = "美国",
}