@inproceedings{fceb0c223a9745d9864b268ba5f2515b,
title = "Refractive index and extinction coefficient measurement of reflective THZ-FDS based on SSKK method for solid sample",
abstract = "We study the spectral information of highly resistive silicon samples by employing terahertz frequency domain reflection spectrometry. The phase shift owing to the tiny displacement between sample and reference could be eliminated by a modified single subtraction Kramers-Kronig method. The refractive index and extinction coefficient of doped silicon range from 0.2THz to 1.0THz has been obtained.",
author = "Yubo Wu and Cunjun Ruan and Yufeng Jiao",
note = "Publisher Copyright: {\textcopyright} 2024 IEEE.; 49th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2024 ; Conference date: 01-09-2024 Through 06-09-2024",
year = "2024",
doi = "10.1109/IRMMW-THz60956.2024.10697798",
language = "英语",
series = "International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz",
publisher = "IEEE Computer Society",
booktitle = "2024 49th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2024",
address = "美国",
}