Rapid Pattern-Oriented Scenario-Based Testing for Embedded Systems

  • Wei Tek Tsai
  • , Ray Paul
  • , Lian Yu
  • , Xiao Wei

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

Abstract

Systems change often, and each change requires reverification and revalidation. Modern software development processes such as agile process even welcome and accommodate frequent software changes. Traditionally, software reverification and revalidation are handled by regression testing. This chapter presents a patternoriented scenario-based approach to rapidly reverify and revalidate frequently changed software. Key features of this approach are (1) classifying system scenarios into reusable patterns; (2) application of a formal completeness analysis to identify missing scenarios; (3) identifying scenario patterns (SPs) and corresponding verification patterns (VPs) and robustness patterns (RBPs); (4) rapid test script generation by reusing test script templates. This approach is also compatible with formal approaches such as model checking. This approach has been used at industrial sites to test safetycritical medical devices with significant savings in cost and effort. The chapter presents several examples to illustrate the effectiveness and efficiency of this approach.

Original languageEnglish
Title of host publicationSoftware Evolution with UML and XML
PublisherIGI Global
Pages222-262
Number of pages41
ISBN (Electronic)9781591404644
ISBN (Print)9781591404620
DOIs
StatePublished - 1 Jan 2004
Externally publishedYes

Fingerprint

Dive into the research topics of 'Rapid Pattern-Oriented Scenario-Based Testing for Embedded Systems'. Together they form a unique fingerprint.

Cite this