Abstract
The impact of complex band structure on the subthreshold current behavior of CNTFETs was reported. In the upper subthreshold region and ON state, the simulation results from the quantum transport and semiclassical model were comparable. From the calculations, the on-off current ratio of the 10 nm CNTFET was of the order of 104. This result show that nanoscale CNTFETs could exhibit more significant and qualitative different behavior of subthreshold leakage current as compared to that of their Si-based counterparts.
| Original language | English |
|---|---|
| Pages (from-to) | 1597-1599 |
| Number of pages | 3 |
| Journal | Journal of Applied Physics |
| Volume | 95 |
| Issue number | 3 |
| DOIs | |
| State | Published - 1 Feb 2004 |
| Externally published | Yes |
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