Skip to main navigation Skip to search Skip to main content

Quality variation control oriented product infant failure risk mitigation strategy based on risk chain

  • Chunling Zhu
  • , Yihai He
  • , Jiaming Cui
  • , Fengdi Liu
  • Beihang University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Infant failure seriously affects customer satisfaction, which is mainly determined by quality variations in manufacturing process, and it is the most critical part of product quality risk. However, most of manufacturers subject to lack of targeted quality variation controlling for infant failure risk, which causes neglecting of preventing and mitigating infant failure risk. Therefore, in this paper, first, an infant failure risk chain is put forward to clarify the formation mechanism from process variation to infant failure. And second, based on forward analysis of the chain, infant failure risk is quantitatively modeled. Third, according to the analysis results, the key process variations are identified by backward analysis of the chain. And variation controlling costs and infant failure losses costs are comprehensively considered to optimize process variation controlling. Finally, a case study of a level control system is introduced to verify the applicability of the proposed method. The final result shows that the proposed method has a good performance in infant failure risk mitigation.

Original languageEnglish
Title of host publication2017 2nd International Conference on Reliability Systems Engineering, ICRSE 2017
EditorsDongming Fan, Jun Yang, Ziyao Wang, Tingdi Zhao
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781538609187
DOIs
StatePublished - 8 Sep 2017
Event2nd International Conference on Reliability Systems Engineering, ICRSE 2017 - Huairou, Beijing, China
Duration: 10 Jul 201712 Jul 2017

Publication series

Name2017 2nd International Conference on Reliability Systems Engineering, ICRSE 2017

Conference

Conference2nd International Conference on Reliability Systems Engineering, ICRSE 2017
Country/TerritoryChina
CityHuairou, Beijing
Period10/07/1712/07/17

Keywords

  • Infant failure
  • Risk chain
  • Risk mitigation
  • quality variation controlling

Fingerprint

Dive into the research topics of 'Quality variation control oriented product infant failure risk mitigation strategy based on risk chain'. Together they form a unique fingerprint.

Cite this