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PSF Analysis of Reflective Objectives based Nonlinear 4Pi Tomography

  • Chenglong Hao
  • , Changyuan Yu
  • , Hao Li*
  • , Xia Yu
  • , Ying Zhang
  • *Corresponding author for this work
  • National University of Singapore
  • Agency for Science, Technology and Research, Singapore

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We proposed the nonlinear (second harmonic generation) 4Pi type C microscope using reflective objective in mid-infrared region. It provided a potential and practical solution of high resolution, deep penetration tomography in bio-medical application.

Original languageEnglish
Title of host publicationLaser Science, LS 2015
PublisherOptica Publishing Group (formerly OSA)
ISBN (Electronic)9781943580033
StatePublished - 2015
Externally publishedYes
EventLaser Science, LS 2015 - San Jose, United States
Duration: 18 Oct 201522 Oct 2015

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Conference

ConferenceLaser Science, LS 2015
Country/TerritoryUnited States
CitySan Jose
Period18/10/1522/10/15

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