TY - GEN
T1 - Process Variation-Resilient STT-MTJ based TRNG using Linear Correcting Codes
AU - Ali, Rashid
AU - Wang, You
AU - Hou, Zhengyi
AU - Ma, Haoyuan
AU - Zhang, Youguang
AU - Zhao, Weisheng
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/7
Y1 - 2019/7
N2 - With the increasing applications of artificial intelligence (AI) attacks, the requirement for high-quality security system becomes urgent. True random number generator (TRNG) is the core block of many cryptographic systems, of which the security is determined by the randomness source of TRNG. In this paper, stochastic switching behavior of spin transfer torque magnetic tunnel junction (STT-MTJ) device is exploited for generation of random numbers. Stochastic switching of STT-MTJ provides an excellent physical randomness source. However, due to the limited technology and correlation between different process steps, process variation has a significant impact on the randomness of MTJ based TRNG. Therefore, post processing-based control mechanism is also necessary to guarantee reliable randomness. The method of linear corrector is integrated into STT-MTJ based TRNG, resulting in improved entropy of randomness. The design is implemented by a 40nm CMOS technology and a compact model of the MTJ. By using the output random bitstream with and without process variations, the efficiency of linear corrector is demonstrated by passing the National Institute of Standards and Technology (NIST) statistical test suite.
AB - With the increasing applications of artificial intelligence (AI) attacks, the requirement for high-quality security system becomes urgent. True random number generator (TRNG) is the core block of many cryptographic systems, of which the security is determined by the randomness source of TRNG. In this paper, stochastic switching behavior of spin transfer torque magnetic tunnel junction (STT-MTJ) device is exploited for generation of random numbers. Stochastic switching of STT-MTJ provides an excellent physical randomness source. However, due to the limited technology and correlation between different process steps, process variation has a significant impact on the randomness of MTJ based TRNG. Therefore, post processing-based control mechanism is also necessary to guarantee reliable randomness. The method of linear corrector is integrated into STT-MTJ based TRNG, resulting in improved entropy of randomness. The design is implemented by a 40nm CMOS technology and a compact model of the MTJ. By using the output random bitstream with and without process variations, the efficiency of linear corrector is demonstrated by passing the National Institute of Standards and Technology (NIST) statistical test suite.
KW - linear correcting code
KW - process variation
KW - spin transfer torque magnetic tunnel junction
KW - stochastic switching
KW - True random number generator
UR - https://www.scopus.com/pages/publications/85084957854
U2 - 10.1109/NANOARCH47378.2019.181294
DO - 10.1109/NANOARCH47378.2019.181294
M3 - 会议稿件
AN - SCOPUS:85084957854
T3 - NANOARCH 2019 - 15th IEEE/ACM International Symposium on Nanoscale Architectures, Proceedings
BT - NANOARCH 2019 - 15th IEEE/ACM International Symposium on Nanoscale Architectures, Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 15th IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH 2019
Y2 - 17 July 2019 through 19 July 2019
ER -