Abstract
In this paper, it is introduced that using a cooling apparatus based on liquid nitrogen, we have prepared NiOx films with nano-microcrystalline structure by reactive magnetron sputtering. X-ray diffiration (XRD) and Images of scanning electron microscope (SEM) demonstrate that when we employ equal sputtering parameters, using this method, we can effectively regulate or control grain size of NiOx films with nano-microcrystalline structure.
| Original language | English |
|---|---|
| Pages (from-to) | 1618-1621 |
| Number of pages | 4 |
| Journal | Gongneng Cailiao/Journal of Functional Materials |
| Volume | 39 |
| Issue number | 10 |
| State | Published - Oct 2008 |
Keywords
- Magnetron sputtering
- Nano-microcrystalline structure
- NiO films
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