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Posbist reliability behavior of fault-tolerant systems

  • Cai Kai-Yuan*
  • , Wen Chuan-Yuan
  • , Zhang Ming-Lian
  • *Corresponding author for this work
  • Beihang University

Research output: Contribution to journalArticlepeer-review

Abstract

Posbist reliability theory is based on the possibility assumption and the binary-state assumption. In this paper we discuss posbist reliability behaviour of fault-tolerant systems, including cold redundant systems and warm redundant systems. In each type of fault-tolerant systems, the conversion switchs may behave in different ways, such as absolutely reliable, non-absolutely reliable with 0-1 mode, non-absolutely reliable with continuous mode. So the system posbist reliability behaviour varies. We express the system posbist reliability in terms of a system lifetime. When the system posbist reliability exhibits as a fuzzy variable in itself, we redefine the system posbist reliability by use of a new expression.

Original languageEnglish
Pages (from-to)49-56
Number of pages8
JournalMicroelectronics Reliability
Volume35
Issue number1
DOIs
StatePublished - Jan 1995

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