Abstract
Cerium (Ce) and ytterbium (Yb) co-doped silicon oxide (SiOx: Ce, Yb) thin films were deposited by using magnetron co -sputtering technique. The down -conversion photoluminescence (PL) properties and structural evolution of the films after thermal treatments were studied. Under the excitation of a He-Cd 325 line, light emissions from the Ce3+ ions are rather weak while quite strong from the Yb3+ ions; the Yb PL intensity increases with elevating the anneal temperature, and both PL excitation and decay spectra indicate that energy transfer from Ce3+ to Yb3+ ions has taken place in the oxides. X-ray diffraction patterns show that Ce and Yb -related silicates have formed as the annealing temperature is higher than 1000°C. The authors believe that the Yb PL can be enhanced greatly by forming high - luminescent Ce3+-related silicates in the oxide films, and thus increase the down-conversion efficiency.
| Original language | English |
|---|---|
| Pages (from-to) | 595-599 |
| Number of pages | 5 |
| Journal | Infrared and Laser Engineering |
| Volume | 43 |
| Issue number | 2 |
| State | Published - Feb 2014 |
Keywords
- Down conversion
- Rear-earth doped
- Silicate
- Silicon oxide film
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