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Photodetection application of one-step synthesized wafer-scale monolayer MoS2 by chemical vapor deposition

  • Lixuan Liu
  • , Kun Ye
  • , Zhipeng Yu
  • , Zhiyan Jia*
  • , Jianyong Xiang
  • , Anmin Nie
  • , Fusheng Wen
  • , Congpu Mu
  • , Bocong Wang
  • , Ying Li
  • , Yongji Gong
  • , Zhongyuan Liu
  • *Corresponding author for this work
  • Beihang University
  • Yanshan University
  • Shenzhen University
  • International Iberian Nanotechnology Laboratory

Research output: Contribution to journalArticlepeer-review

Abstract

Monolayer MoS2 is a known candidate to replace silicon-based materials for photodetection purposes. Achieving industrial production and application of MoS2 calls for efficient and economic synthesis of such material. Here, we report a one-step and low-cost chemical vapor deposition method for the controlled synthesis of high quality and uniform wafer-scale (approximately 9.5 × 4.5 cm) monolayer MoS2 film on SiO2/Si substrates. Using the as-synthesized MoS2 films, MoS2/PbS quantum dot hybrid device arrays are also fabricated. These hybrid devices have broad spectral photoresponse (457-1064 nm), rapid response rate, high responsivity of approximately 1.8 × 104 A W-1, and ultrahigh detectivity of approximately 7.6 × 1013 Jones, which outperforms other pristine two-dimensional as well as commercial Si and InGaAs materials. This low-cost and efficient method of growing wafer-scale monolayer MoS2, as well as the excellent performance of its hybrid device arrays, will strongly support the production and application of monolayer MoS2 in the future.

Original languageEnglish
Article number025020
Journal2D Materials
Volume7
Issue number2
DOIs
StatePublished - 2020

Keywords

  • MoS
  • detectivity
  • monolayer
  • responsivity
  • wafer-scale

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