Abstract
Transparent TiO2 and TiO2-xNx thin films were prepared on glass substrates by r. f. magnetron sputtering. The crystalline structure, surface morphology, photocatalysis of the films were characterized by X-ray diffraction (XRD), atomic force microscopy (AFM) and UV-Vis spectrophotometer. The results showed that most TiO2-xNx thin films were anatase phase. A new crystalline phase was found in the nitrogen-rich film. The absorption edge of thin films were shifted to the lower-energy region with increasing of N2 /Ar gas flow ratio. The nitrogen-doped TiO2 thin film prepared with 3:100 sccm N2/Ar shows better photocatalytic activity at visible light region.
| Original language | English |
|---|---|
| Pages (from-to) | 464-466 |
| Number of pages | 3 |
| Journal | Gongneng Cailiao/Journal of Functional Materials |
| Volume | 36 |
| Issue number | 3 |
| State | Published - Mar 2005 |
Keywords
- Magnetron sputtering
- Nitrogen-doped TiO thin film
- Photocatalytic
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