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Phosphorus-doped bismuth telluride films by electrodeposition

  • Jian Zhou*
  • , Qinghan Lin
  • , Hengyi Li
  • , Xuan Cheng
  • *Corresponding author for this work
  • College of Materials
  • Xiamen University

Research output: Contribution to journalArticlepeer-review

Abstract

Phosphorus-doped Bi2Te3 films were synthesized on a stainless-steel electrode by electrochemical deposition. X-ray diffraction, scanning electron microscopy and transmission electron microscopy confirmed that the films are single-phased Bi2Te3 solid solutions with a rhombohedral structure. The as-prepared films exhibit n-type characteristics with the Hall coefficient -1.76E-2 m3 C-1 and the electrical conductivity 280 S cm-1. The thermal conductivity is 0.47 W m-1 K-1, which is as low as one-third of the value observed in the bulk material. The doped P atoms occupy the interstitial positions between the two adjacent Te(1) layers connected by Van der Waals interaction in Bi2Te3

Original languageEnglish
Pages (from-to)401-405
Number of pages5
JournalMaterials Chemistry and Physics
Volume141
Issue number1
DOIs
StatePublished - 15 Aug 2013
Externally publishedYes

Keywords

  • A. Chalcogenides
  • C. Electrochemical techniques
  • C. Electron microscopy
  • D. Electrical conductivity
  • D. Thermal conductivity

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