Phase separation of PS/PVME blend films induced by capillary force

Xue Li; Zhe Wang; Liang Cui; Rubo Xing; Yanchun Han; Lijia An

doi:10.1016/j.susc.2004.07.052

Phase separation of PS/PVME blend films induced by capillary force

Xue Li
, Zhe Wang
, Liang Cui
, Rubo Xing
, Yanchun Han^*
, Lijia An

^*Corresponding author for this work

CAS - Changchun Institute of Applied Chemistry

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

The phase behavior of a miscible PS/PVME (80/20, w/w) blend film in a confined geometry has been investigated at the annealing temperature much lower than the low critical solution temperature (LCST) of the blend. When the annealing temperature (52°C) is near the glass transition temperature of the blend (51.2°C), PVME-rich phase at the air-film surface under a microchannel forms smaller protrusion. When the annealing temperature is increased to 70°C, the protruding stripes, which are almost developed, are mainly composed of the mobile PVME-rich phase. These results reveal that the capillary force lead to the enrichment of PVME-rich phase at the air-polymer interface of a PDMS microchannel, that is, the capillary force lithography (CFL) can induce the phase separation of PS/PVME blend films.

Original language	English
Pages (from-to)	12-20
Number of pages	9
Journal	Surface Science
Volume	571
Issue number	1-3
DOIs	https://doi.org/10.1016/j.susc.2004.07.052
State	Published - 1 Nov 2004
Externally published	Yes

Keywords

Atomic force microscopy
Polycrystalline thin films
X-ray photoelectron spectroscopy

Access to Document

10.1016/j.susc.2004.07.052

Cite this

@article{c9fce1ca909143a5847cc8ad132b4c85,

title = "Phase separation of PS/PVME blend films induced by capillary force",

abstract = "The phase behavior of a miscible PS/PVME (80/20, w/w) blend film in a confined geometry has been investigated at the annealing temperature much lower than the low critical solution temperature (LCST) of the blend. When the annealing temperature (52°C) is near the glass transition temperature of the blend (51.2°C), PVME-rich phase at the air-film surface under a microchannel forms smaller protrusion. When the annealing temperature is increased to 70°C, the protruding stripes, which are almost developed, are mainly composed of the mobile PVME-rich phase. These results reveal that the capillary force lead to the enrichment of PVME-rich phase at the air-polymer interface of a PDMS microchannel, that is, the capillary force lithography (CFL) can induce the phase separation of PS/PVME blend films.",

keywords = "Atomic force microscopy, Polycrystalline thin films, X-ray photoelectron spectroscopy",

author = "Xue Li and Zhe Wang and Liang Cui and Rubo Xing and Yanchun Han and Lijia An",

year = "2004",

month = nov,

day = "1",

doi = "10.1016/j.susc.2004.07.052",

language = "英语",

volume = "571",

pages = "12--20",

journal = "Surface Science",

issn = "0039-6028",

publisher = "Elsevier B.V.",

number = "1-3",

}

TY - JOUR

T1 - Phase separation of PS/PVME blend films induced by capillary force

AU - Li, Xue

AU - Wang, Zhe

AU - Cui, Liang

AU - Xing, Rubo

AU - Han, Yanchun

AU - An, Lijia

PY - 2004/11/1

Y1 - 2004/11/1

N2 - The phase behavior of a miscible PS/PVME (80/20, w/w) blend film in a confined geometry has been investigated at the annealing temperature much lower than the low critical solution temperature (LCST) of the blend. When the annealing temperature (52°C) is near the glass transition temperature of the blend (51.2°C), PVME-rich phase at the air-film surface under a microchannel forms smaller protrusion. When the annealing temperature is increased to 70°C, the protruding stripes, which are almost developed, are mainly composed of the mobile PVME-rich phase. These results reveal that the capillary force lead to the enrichment of PVME-rich phase at the air-polymer interface of a PDMS microchannel, that is, the capillary force lithography (CFL) can induce the phase separation of PS/PVME blend films.

AB - The phase behavior of a miscible PS/PVME (80/20, w/w) blend film in a confined geometry has been investigated at the annealing temperature much lower than the low critical solution temperature (LCST) of the blend. When the annealing temperature (52°C) is near the glass transition temperature of the blend (51.2°C), PVME-rich phase at the air-film surface under a microchannel forms smaller protrusion. When the annealing temperature is increased to 70°C, the protruding stripes, which are almost developed, are mainly composed of the mobile PVME-rich phase. These results reveal that the capillary force lead to the enrichment of PVME-rich phase at the air-polymer interface of a PDMS microchannel, that is, the capillary force lithography (CFL) can induce the phase separation of PS/PVME blend films.

KW - Atomic force microscopy

KW - Polycrystalline thin films

KW - X-ray photoelectron spectroscopy

UR - https://www.scopus.com/pages/publications/6444220890

U2 - 10.1016/j.susc.2004.07.052

DO - 10.1016/j.susc.2004.07.052

M3 - 文章

AN - SCOPUS:6444220890

SN - 0039-6028

VL - 571

SP - 12

EP - 20

JO - Surface Science

JF - Surface Science

IS - 1-3

ER -

Phase separation of PS/PVME blend films induced by capillary force

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this