Phase interrogation sensitivity analysis for surface plasmon resonance sensors

Zhiyou Wang; Zheng Zheng; Yusheng Bian; Jinsong Zhu

doi:10.1364/ls.2012.lth1j.2

Phase interrogation sensitivity analysis for surface plasmon resonance sensors

Zhiyou Wang
, Zheng Zheng
, Yusheng Bian
, Jinsong Zhu^*

^*Corresponding author for this work

School of Electronic and Information Engineering

National Center for Nanoscience and Technology
Beihang University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Sensitivity of phase interrogation using surface plasmon resonance sensors with various metal film thicknesses are analyzed at different wavelengths. Theoretical analysis reveals that reasonable sensitivities with moderate dynamic ranges can be obtained under specific configurations.

Original language	English
Title of host publication	Laser Science, LS 2012
Publisher	Optical Society of America (OSA)
ISBN (Print)	9781557529565
DOIs	https://doi.org/10.1364/ls.2012.lth1j.2
State	Published - 2012
Event	Laser Science, LS 2012 - Rochester, NY, United States Duration: 14 Oct 2012 → 18 Oct 2012

Publication series

Name	Laser Science, LS 2012

Conference

Conference	Laser Science, LS 2012
Country/Territory	United States
City	Rochester, NY
Period	14/10/12 → 18/10/12

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10.1364/ls.2012.lth1j.2

Cite this

@inproceedings{f9030a670d8346ca9ad3a38a9cd07855,

title = "Phase interrogation sensitivity analysis for surface plasmon resonance sensors",

abstract = "Sensitivity of phase interrogation using surface plasmon resonance sensors with various metal film thicknesses are analyzed at different wavelengths. Theoretical analysis reveals that reasonable sensitivities with moderate dynamic ranges can be obtained under specific configurations.",

author = "Zhiyou Wang and Zheng Zheng and Yusheng Bian and Jinsong Zhu",

year = "2012",

doi = "10.1364/ls.2012.lth1j.2",

language = "英语",

isbn = "9781557529565",

series = "Laser Science, LS 2012",

publisher = "Optical Society of America (OSA)",

booktitle = "Laser Science, LS 2012",

note = "Laser Science, LS 2012 ; Conference date: 14-10-2012 Through 18-10-2012",

}

TY - GEN

T1 - Phase interrogation sensitivity analysis for surface plasmon resonance sensors

AU - Wang, Zhiyou

AU - Zheng, Zheng

AU - Bian, Yusheng

AU - Zhu, Jinsong

PY - 2012

Y1 - 2012

N2 - Sensitivity of phase interrogation using surface plasmon resonance sensors with various metal film thicknesses are analyzed at different wavelengths. Theoretical analysis reveals that reasonable sensitivities with moderate dynamic ranges can be obtained under specific configurations.

AB - Sensitivity of phase interrogation using surface plasmon resonance sensors with various metal film thicknesses are analyzed at different wavelengths. Theoretical analysis reveals that reasonable sensitivities with moderate dynamic ranges can be obtained under specific configurations.

UR - https://www.scopus.com/pages/publications/85087597928

U2 - 10.1364/ls.2012.lth1j.2

DO - 10.1364/ls.2012.lth1j.2

M3 - 会议稿件

AN - SCOPUS:85087597928

SN - 9781557529565

T3 - Laser Science, LS 2012

BT - Laser Science, LS 2012

PB - Optical Society of America (OSA)

T2 - Laser Science, LS 2012

Y2 - 14 October 2012 through 18 October 2012

ER -

Phase interrogation sensitivity analysis for surface plasmon resonance sensors

Abstract

Publication series

Conference

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