Performance of pentacene thin film transistors fabricated with different deposition speeds

  • Hui Kun Yao*
  • , Lei Sun
  • , You Feng Geng
  • , Yu Qian Xia
  • , Yi Jiao Wang
  • , Zhi Yuan Lun
  • , Tai Huan Wang
  • , Wen Tong Zhu
  • , De Dong Han
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Bottom-gated pentacene thin film transistors have been fabricated with different deposition speeds and the devices' current-voltage properties are reported. The pentacene films are formed through evaporation in low pressure. The characteristics of the surface morphologies and microstructures of the samples were studied respectively. We also studied the transfer characteristics and output properties. Pentacene-TFTs can exhibit excellent electrical properties while Vg changes from 0 to -70V, and Ion/I off ratio is larger than 104 and OFF-state current is smaller than -1.3×10-10A as Vd=-100V.

Original languageEnglish
Title of host publicationICSICT 2012 - 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, Proceedings
DOIs
StatePublished - 2012
Externally publishedYes
Event2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2012 - Xi'an, China
Duration: 29 Oct 20121 Nov 2012

Publication series

NameICSICT 2012 - 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, Proceedings

Conference

Conference2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2012
Country/TerritoryChina
CityXi'an
Period29/10/121/11/12

Keywords

  • Pentacene-TFT
  • electrical properties
  • evaporation

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