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Performance investigation on the reconfigurable Si nanowire schottky barrier transistors

  • Juncheng Wang*
  • , Gang Du
  • , Zhiyuan Lun
  • , Kangliang Wei
  • , Lang Zeng
  • , Xiaoyan Liu
  • *Corresponding author for this work
  • Peking University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper, the performance of the reconfigurable Si nanowire schottky barrier transistors (RFETs) is investigated with simulation method. In contrast to conventional Schottky barrier MOSFETs (SB-MOSFETs) and silicon nanowire transistors (Si-NWTs) with metal/silicide as source/drain, the separate two gates in RFETs are located at the two Schottky junctions. Our simulation results show the variable electric characteristics and working principle of the RFETs working as p-/n-type. The RFETs exhibit higher on/off current ratio compared with other Schottky transistors.

Original languageEnglish
Title of host publicationICSICT 2012 - 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, Proceedings
DOIs
StatePublished - 2012
Externally publishedYes
Event2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2012 - Xi'an, China
Duration: 29 Oct 20121 Nov 2012

Publication series

NameICSICT 2012 - 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, Proceedings

Conference

Conference2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2012
Country/TerritoryChina
CityXi'an
Period29/10/121/11/12

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