TY - GEN
T1 - Performance investigation on the reconfigurable Si nanowire schottky barrier transistors
AU - Wang, Juncheng
AU - Du, Gang
AU - Lun, Zhiyuan
AU - Wei, Kangliang
AU - Zeng, Lang
AU - Liu, Xiaoyan
PY - 2012
Y1 - 2012
N2 - In this paper, the performance of the reconfigurable Si nanowire schottky barrier transistors (RFETs) is investigated with simulation method. In contrast to conventional Schottky barrier MOSFETs (SB-MOSFETs) and silicon nanowire transistors (Si-NWTs) with metal/silicide as source/drain, the separate two gates in RFETs are located at the two Schottky junctions. Our simulation results show the variable electric characteristics and working principle of the RFETs working as p-/n-type. The RFETs exhibit higher on/off current ratio compared with other Schottky transistors.
AB - In this paper, the performance of the reconfigurable Si nanowire schottky barrier transistors (RFETs) is investigated with simulation method. In contrast to conventional Schottky barrier MOSFETs (SB-MOSFETs) and silicon nanowire transistors (Si-NWTs) with metal/silicide as source/drain, the separate two gates in RFETs are located at the two Schottky junctions. Our simulation results show the variable electric characteristics and working principle of the RFETs working as p-/n-type. The RFETs exhibit higher on/off current ratio compared with other Schottky transistors.
UR - https://www.scopus.com/pages/publications/84874821737
U2 - 10.1109/ICSICT.2012.6467586
DO - 10.1109/ICSICT.2012.6467586
M3 - 会议稿件
AN - SCOPUS:84874821737
SN - 9781467324724
T3 - ICSICT 2012 - 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, Proceedings
BT - ICSICT 2012 - 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, Proceedings
T2 - 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2012
Y2 - 29 October 2012 through 1 November 2012
ER -