PCB infrared thermal imaging diagnosis using support vector classifier

  • Jiuqing Wan*
  • , Xingshan Li
  • *Corresponding author for this work

Research output: Contribution to conferencePaperpeer-review

Abstract

A Printed Circuit Board (PCB) diagnosis system based on infrared thermal imaging is described in this paper. Multi-scale edge detection and nonlinear regression methods are used for heat source recognition and thermal feature extraction respectively. Thermal pattern recognition is implemented by support vector classifier instead of traditional Back-Propagation Feed-Forward Network (BPFFN) classifier, which generates poorly on the diagnosis application, and good experimental result has been achieved.

Original languageEnglish
Pages2718-2722
Number of pages5
StatePublished - 2002
EventProceedings of the 4th World Congress on Intelligent Control and Automation - Shanghai, China
Duration: 10 Jun 200214 Jun 2002

Conference

ConferenceProceedings of the 4th World Congress on Intelligent Control and Automation
Country/TerritoryChina
CityShanghai
Period10/06/0214/06/02

Keywords

  • Diagnosis
  • PCB
  • Support vector classifier

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