Abstract
Specific emitter identification (SEI) is a passive physical layer authentication technology that mines subtle hardware differences between emitters to identify devices. However, traditional deep-learning-based SEI is trained for scenarios with massive signal samples and performs poorly in sample-limited scenarios. To solve this problem, we proposed a robust few-shot SEI (FS-SEI) method using dual-level data augmentation, consisting of phase shift position prediction and Manifold CutMix (P3MC). We perform data augmentation in both the sample space and the feature space to accelerate the complex valued time-series lightweight adaptive network (CV-TSLANet) to learn robust features and use machine learning to identify ADS-B emitters. Our experimental results show that the performance of our proposed FS-SEI method reaches 90% when the number of samples per category is 30. We have open-sourced the proposed FS-SEI method at https://github.com/IcedWatermelonJuice/P3MC.
| Original language | English |
|---|---|
| Pages (from-to) | 38668-38679 |
| Number of pages | 12 |
| Journal | IEEE Internet of Things Journal |
| Volume | 12 |
| Issue number | 18 |
| DOIs | |
| State | Published - 2025 |
Keywords
- Data augmentation
- feature augmentation
- few-shot learning (FSL)
- self-supervised learning
- specific emitter identification (SEI)
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